High Voltage Electron Microscopy の履歴(No.1)



High Voltage Electron Microscopy


Review papers for High Voltage Electron Microscopy (Materials Science)

REFERENCES [1] H. Fujita: J. of Electron Micro. Tech. 3, 243–304 (1986).
[2] H. Fujita.: J. of Electron Micro. Tech. 12, 201–218 (1989).
[3] A. Seeger: J. of Electron Micro. 48, 301-305 (1999).
[4] H. Fujita: Proc. Jpn. Acad., Ser. B, Vol. 81, 141-155 (2005).
[5] H. Mori: J. of Electron Micro., 60, S189-S197 (2001).
[6] H. Yasuda: Kenbikyo, 46, 160-164 (2011). (in Japanese)


Features of the ultra-high voltage electron microscope (H-3000)

photo

Figure 1 Ultra-High Voltage Electron Microscope - Hitachi H-3000 in Osaka University


The 3 MV ultra-high voltage electron microscope (Hitachi H-3000) was developed based on various advanced technologies, such as the high stability of the high voltage generating circuit, the reduction of power losses, the improvement of the response speed of the objective lens, negative ion removal equipment, a remote control system, and an online image enhancement system. The ultra-high voltage electron microscope is widely used by researchers in many fields, including materials science, nanotechnology, biology, and medical science. The particular advantages of the H-3000 can be summarized as follows:

  1. Remarkable increases in the maximum observable thickness of a specimen.
  2. Various types of in-situ observations made possible by the very large specimen space.
  3. Lattice defect introduction and/or non-equilibrium phase formation through the interaction between high energy electrons and constituent elements in materials.
    Main specifications

トップ   新規 一覧 検索 最終更新   ヘルプ   最終更新のRSS